Description
PXIE-5122 779967-03 High-Speed Digitizer
Product Description
The National Instruments PXIe-5122 (Part Numbers: 779967-01, 779967-02, and 779967-03) High-Speed Digitizer, based on the the SMC engineering, accompanies fast memory choices from 8 to 512 MB for each channel (4 to 256 million 14-bit tests per channel). The NI PXIe-5122 acquires more than 1 million triggered waveforms without software intervention in multiple-record acquisition mode for applications, such as RADAR, ultrasound, and event recognition, which require short trigger rearm times. Additionally, the user can timestamp each triggered event with 100 ps resolution in both single-shot and various record acquisition modes. The PXIe-5122 can also stream information persistently from installed memory to have memory for longer acquisitions and streaming to disk.
Each National Instruments Digitizer accompanies the IVI-compliant NI-SCOPE driver, which is completely compatible with NI LabVIEW, LabWindows/CVI, and Measurement Studio for Visual Studio 6.0 and.NET. NI-SCOPE incorporates more than 50 built-in estimation and examination capacities, along with an intuitive SCOPE Soft Front Panel.
The high-resolution NI PXI-5122 Oscilloscope/Digitizer is suited for a wide assortment of uses in automotive, communications, scientific research, military/aviation, and consumer electronics.

PXIE-5122
Product parameter
This Oscilloscope comes equipped with these features:
• A 100-MHz, 100 Msamples/sec, 14-bit digitizer in PXI format
• Two channels all the while tested at 14-bit resolution
• 100 Msamples/sec real-time and 2.0 Gsamples/sec random interleaved sampling
• 100 MHz transmission capacity
• 50 ohm or 1 Mohm input impedance, programming selectable
• 200mV to 20V info go
• 75 dBc SFDR and 62 dB SINAD
• 8, 32, or 256 Mbytes of memory for each channel
• Edge, window, hysteresis, video, and advanced triggering with 100 ps timestamping
• Compatible working frameworks: Windows 2000/XP
• Includes NI-SCOPE driver programming
Application field
PXIe-5122 has a wide range of applications, which can be summarized as follows:
Radar, ultrasound and Event recognition:
The PXIe-5122 high-speed digitizer offers excellent performance, including a fast memory selection of 8 to 512 MB per channel, and a timestamp resolution of 100 ps. This makes it excellent in applications that require short trigger restart times, such as radar, ultrasound, and event recognition.
Automotive sector:
The PXIe-5122’s high resolution and high-speed sampling capabilities make it an ideal tool for testing and measurement in the automotive sector. It can be used in automotive control systems, sensor testing, etc., to ensure the performance and safety of the car under various conditions.
Communication field:
With a bandwidth of 100 MHz and a sampling rate of 100 MS/s, this digitizer is suitable for signal testing and verification in communication systems. It can help engineers evaluate receiver performance, simulate signals of different frequencies, amplitudes and phases, and conduct research on communication technologies such as modulation and demodulation.
Scientific research:
The precision and reliability of the PXIe-5122 make it an invaluable tool for scientific research. It can be used in various fields such as physics experiments, signal processing and analysis to help scientists and researchers obtain accurate data and results.
Military/Aviation:
In the military and aviation sectors, the high performance and reliability of the PXIe-5122 is critical to ensure the stable operation of the system. It can be used to test a variety of complex avionics, missile control systems, etc., to verify their performance and reliability.
Consumer electronics:
In the development and testing of consumer electronics products, the PXIe-5122’s high-speed sampling and precise measurement capabilities provide critical performance data to help manufacturers improve product design and product quality.
To sum up, the PXIe-5122 plays an important role in multiple industries with its outstanding performance, reliability and wide range of applications. It can not only meet a variety of complex test and measurement needs, but also improve production efficiency, reduce costs, and drive technology development and innovation.
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