The VM600Mk2/VM600 XMx16 + XIO16T extended condition monitoring modules are designed for operation with the VM600Mk2/VM600 rack-based machinery monitoring systems, from Meggitt’s vibro-meter® product line. A XMx16 + XIO16T module consists of a processing module and a input/output (interface) module that provide 16 dynamic and 4 tachometer channels of highperformance machinery condition monitoring. Note: The XMV16 + XIO16T module is optimised for machinery vibration monitoring applications and the XMC16 + XIO16T module is optimised for machinery combustion monitoring applications.

The XMx16 + XIO16T extended condition monitoring modules are latest-generation condition monitoring modules, which together with the VibroSight® software, offer several key advantages over the CMC16/IOC16T card pair and VM600 CMS software that they replace: state-of-the-art technology, stronger system capabilities (increased amplitude and spectral resolution, more buffer memory for pre-event and post-event data, more powerful module-level processing, faster data acquisition and storage rates), improved software interface with powerful high-resolution plots, integrated data management, and simplified network access with open interfaces.

An XMx16 + XIO16T module provides all of the interfacing and signal processing functions required of an intelligent data acquisition system and is a central element in VM600Mk2/VM600 rack-based machinery monitoring solutions. The modules are designed for operation with the VibroSight® software: they acquire and analyse vibration data before communicating the results directly to a host computer running VibroSight® using the on-board Ethernet controller.

The XMx16 processing module is installed in the front of the rack and the XIO16T module is installed in the rear. Either a VM600Mk2/VM600 standard rack (ABE04x) or slimline rack (ABE056) can be used and each module connects directly to the rack’s backplane using two connectors.

The XMx16 + XIO16T is fully software configurable and can be programmed to capture data based on time (for example, continuously at scheduled intervals), events, machine operating conditions or other system variables. Individual measurement channel parameters including frequency bandwidth, spectral resolution, windowing function and averaging can also be configured to meet the needs of specific applications.